ENERGY 30 Fourier Transform Infrared Spectrometers FTIR

Product Description

Spectral region:7800~350cm-1

Resolution ratio:Than1.0cm-1

Wavenumber accuracy:≤0.01cm-1

SNR:40000:1

Beam splitter:Germanium plating on KBr substrate

light source:High energy, high efficiency, long life ceramic light source

Interferometer:Non-orthogonal Michelson

Aeeeptor:High sensitivity DLATGS receiver with moisture-proof film

Size:450mmx350mmx210mm

Weight:13kg

Data transfer:USB2.0/3.0

Support system:Windows XP/Vista/7/8/8.1/10

Product Detail

Fourier Transform Infrared Spectrometers FTIR Presentation

The ENERGY-30 Fourier Transform Infrared Spectrometer integrates advanced international technologies with a mature, efficient design. Its performance and key technical specifications meet global standards.

  • The Michelson interferometer is DSP-controlled, allowing continuous dynamic adjustment and automatic energy optimization without manual intervention.

  • 3D right-angle gold-plated reflective mirrors remain fixed, ensuring collimated optical paths without mechanical adjustments.

  • SuperTect digital electronics provide fully digital 24-bit, 500 kHz A/D conversion and high-speed USB output for real-time, reliable spectral data.

  • An industrial-grade temperature and humidity module displays digital readings and triggers a humidity alarm to protect core components.

  • The sealed optical cavity and reusable 304 stainless steel desiccant boxes enhance moisture protection and extend component life.

  • The non-orthogonal Michelson design improves energy utilization.

  • A 24W silicon carbide infrared source with stabilized digital power ensures long-lasting, stable light output.

  • Long-life diode lasers, specially coated slides, detectors, and beam splitters (KBr, ZnSe, CaF₂) enhance transmittance and resist moisture corrosion.

  • Precision SPDT-cut optical mirrors ensure high reflectivity and consistent optical alignment.

  • Extensive expansion options support transmission, ATR, diffuse reflection, planar reflection, and external reflection attachments.

High-Precision Spectral Analysis

ENERGY-30 features advanced optics and sensitive detectors to deliver accurate spectral data with minimal noise. Its automated workflow allows efficient sample measurement and processing. As part of Hench’s lineup of Fourier transform infrared spectrometers, this instrument ensures reliable and reproducible results in demanding lab environments.

User-Friendly and Flexible

  • Compact design fits easily in laboratories with limited space.

  • Intuitive software interface reduces operational complexity for both routine and advanced analyses.

  • Compatible with a wide range of accessories and consumables; complement your setup with Hench’s lab supplies.

Reliable and Versatile Instrumentation

  • High-stability components provide consistent performance over long-term use.

  • Suitable for various research applications, from qualitative identification to quantitative analysis.

  • ENERGY-30 can be integrated into broader lab workflows alongside other instruments such as hydraulic presses machines for sample preparation.

Principle of Instrument

ENERGY-30 FTIR uses the working principle of interferometer frequency modulation. The light emitted by the source passes through the Michelson interferometer to form interference light, which then irradiates the sample. The receiver collects the interference light carrying the sample information, and the computer software processes it through Fourier transform to obtain the sample spectrum.

Experimental Principle

ATR is designed based on the principle of internal light reflection. The infrared emitted from a light source passes through a crystal with a high refractive index and is projected onto a crystal with a low refractive index. On the surface, when the incidence Angle is greater than the critical Angle, the incident light will be reflected. In fact, not all infrared light is reflected; instead, it penetrates to a certain depth within the specimen surface and then returns to the surface. In this process, the sample has selective absorption in the region of the incident light frequency. The intensity of the reflected light is weakened, and the spectrum similar to that of the transmitted absorption is produced, so that the structural information of the chemical composition of the surface layer of the sample is obtained.

About Hench

Hench is recognized among leading infrared spectrometer manufacturers, offering high-quality laboratory instruments with a focus on precision, durability, and comprehensive support. Their products are trusted worldwide by universities, research institutes, and industrial laboratories, supporting both everyday testing and advanced scientific research.

Infrared spectrometer display

Infrared spectrometer application

Infrared spectrometer analysis

Principle of Infrared Spectrometer

IR Attachment products

ATR Principle

Infrared spectroscopy measurement spectrum

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